Applications of Tandem Scanning Reflected Light Microscopy and Three‐Dimensional Imaginga
- 16 December 1986
- journal article
- Published by Wiley in Annals of the New York Academy of Sciences
- Vol. 483 (1) , 428-439
- https://doi.org/10.1111/j.1749-6632.1986.tb34553.x
Abstract
No abstract availableThis publication has 17 references indexed in Scilit:
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