Properties of Faults and Criticalities of Values under Tests for Combinational Networks
- 1 July 1975
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Computers
- Vol. C-24 (7) , 746-750
- https://doi.org/10.1109/T-C.1975.224296
Abstract
This correspondence discusses the properties of faults in combinational networks and their relationships with fault-detection and fault-location test sets.Keywords
This publication has 6 references indexed in Scilit:
- Multiple Fault Detection in Combinational NetworksIEEE Transactions on Computers, 1972
- A Nand Model ror Fault Diagnosis in Combinational Logic NetworksIEEE Transactions on Computers, 1971
- Fault Equivalence in Combinational Logic NetworksIEEE Transactions on Computers, 1971
- Programmed Algorithms to Compute Tests to Detect and Distinguish Between Failures in Logic CircuitsIEEE Transactions on Electronic Computers, 1967
- Fault Detection in Redundant CircuitsIEEE Transactions on Electronic Computers, 1967
- Derivation of optimum test sequencies for sequential machinesPublished by Institute of Electrical and Electronics Engineers (IEEE) ,1964