High performance 660 nm InGaP/AIGaInP quantum wellmetal cladding ridge waveguide laser diode

Abstract
A high performance 660 nm metal cladding ridge waveguide laser diode was fabricated from a compressively strained In0.6Ga0.4P/(AlxGa1-x)0.5In0.5P single quantum well laser structure. The 4 µm wide ridge waveguide diode had a threshold current of 31 mA with a differenfial quantum efficiency of 45%/facet (slope efficiency of 0.85 W/A) under CW operation. The characteristic temperature was 120 K from 20 to 75°C. The diode operated in a single transverse mode up to 22 mW/facet.