X-Ray Topographic Study of Defects in Selenium and Tellurium Single Crystals
- 1 June 1969
- journal article
- research article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 40 (7) , 3054-3055
- https://doi.org/10.1063/1.1658128
Abstract
No abstract availableThis publication has 9 references indexed in Scilit:
- Low-Angle Subgrain Boundaries in TelluriumJournal of Applied Physics, 1967
- SINGLE-CRYSTAL SELENIUM FILMSApplied Physics Letters, 1967
- Etch Pits in Hexagonal Selenium CrystalsJournal of Applied Physics, 1967
- Crystallization of Amorphous Selenium Films Prepared by Vacuum-EvaporationJapanese Journal of Applied Physics, 1967
- Photoconductivity measurements in hexagonal selenium single crystalsPhysics Letters, 1966
- Über den elektrischen Leitungsmechanismus von hexagonalen Selen‐EinkristallenPhysica Status Solidi (b), 1964
- Some Effects Occurring in Dislocated TelluriumJournal of Applied Physics, 1960
- Dislocation etch pits in telluriumActa Metallurgica, 1958
- Conductivity, Hall Effect and Thermo-electric Power of Selenium Single CrystalsProceedings of the Physical Society. Section B, 1951