Der zusammenhang zwischen metall-halbleiter-barrieren-höhe und elektronegativität sowie kernladungszahl des metalles
- 30 November 1970
- journal article
- research article
- Published by Elsevier in Solid-State Electronics
- Vol. 13 (11) , 1505-1507
- https://doi.org/10.1016/0038-1101(70)90085-7
Abstract
No abstract availableKeywords
This publication has 7 references indexed in Scilit:
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- Dielectric Definition of ElectronegativityPhysical Review Letters, 1968
- Barrierenhöhen von metall-halbleiterkontaktenSolid State Communications, 1967
- Metal-semiconductor surface barriersSolid-State Electronics, 1966
- METALS CONTACTS ON CLEAVED SILICON SURFACESAnnals of the New York Academy of Sciences, 1963
- A scale of electronegativity based on electrostatic forceJournal of Inorganic and Nuclear Chemistry, 1958
- A New Method of Determining Electronegativity from Other Atomic PropertiesPhysical Review B, 1946