METALS CONTACTS ON CLEAVED SILICON SURFACES
- 1 January 1963
- journal article
- Published by Wiley in Annals of the New York Academy of Sciences
- Vol. 101 (3) , 697-708
- https://doi.org/10.1111/j.1749-6632.1963.tb54926.x
Abstract
No abstract availableKeywords
This publication has 7 references indexed in Scilit:
- Work Function, Photoelectric Threshold, and Surface States of Atomically Clean SiliconPhysical Review B, 1962
- Resistivity of Bulk Silicon and of Diffused Layers in SiliconBell System Technical Journal, 1962
- Mean Free Path of Photoexcited Electrons in AuPhysical Review Letters, 1962
- Hole and electron mobilities in doped silicon from radiochemical and conductivity measurementsJournal of Physics and Chemistry of Solids, 1960
- Contact Potential Difference Measurements by the Kelvin MethodProceedings of the Physical Society. Section B, 1957
- Physical Theory of Semiconductor SurfacesPhysical Review B, 1955
- The Work Function of LithiumPhysical Review B, 1949