DIRECT MEASUREMENT OF THE DEPLETION LAYER WIDTH VARIATION VS APPLIED BIAS FOR A P-N JUNCTION
- 15 November 1965
- journal article
- research article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 7 (10) , 267-269
- https://doi.org/10.1063/1.1754252
Abstract
No abstract availableThis publication has 3 references indexed in Scilit:
- REVERSIBLE CHANGES IN TRANSISTOR CHARACTERISTICS CAUSED BY SCANNING ELECTRON MICROSCOPE EXAMINATIONApplied Physics Letters, 1965
- Evaluation of Passivated Integrated Circuits Using the Scanning Electron MicroscopeJournal of the Electrochemical Society, 1964
- A novel method of semiconductor device measurementsProceedings of the IEEE, 1964