A reliable method of TEM cross section specimen preparation of YBCO films on various substrates
- 20 February 1993
- journal article
- Published by Elsevier in Physica C: Superconductivity and its Applications
- Vol. 206 (3-4) , 318-328
- https://doi.org/10.1016/0921-4534(93)90531-t
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- Sample preparation of YBa2Cu3O7?? for high-resolution electron microscopyJournal of Superconductivity, 1988
- The preparation of transmission electron microscope specimens from compound semiconductors by ion millingUltramicroscopy, 1987
- The preparation of cross‐section specimens for transmission electron microscopyJournal of Electron Microscopy Technique, 1984