High definition aperture probes for near-field optical microscopy fabricated by focused ion beam milling
- 15 June 1998
- journal article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 72 (24) , 3115-3117
- https://doi.org/10.1063/1.121564
Abstract
We have improved the optical characteristics of aluminum-coated fiber probes used in near-field scanning optical microscopy by milling with a focused ion beam. This treatment produces a flat-end face free of aluminum grains, containing a well-defined circularly-symmetric aperture with controllable diameter down to 20 nm. The polarization behavior of the tips is circularly symmetric with a polarization ratio exceeding 1:100. The improved imaging characteristics are demonstrated by measuring single molecule fluorescence. Count rates increase more than one order of magnitude over unmodified probes, and the molecule images map a spatial electric field distribution of the aperture in agreement with calculations.Keywords
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