Control of Aperture Size of Optical Probes for Scanning Near-Field Optical Microscopy Using Focused Ion Beam Technology
- 1 July 1997
- journal article
- Published by IOP Publishing in Japanese Journal of Applied Physics
- Vol. 36 (7B) , L942
- https://doi.org/10.1143/jjap.36.l942
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
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- Combined shear force and near-field scanning optical microscopyApplied Physics Letters, 1992
- Breaking the Diffraction Barrier: Optical Microscopy on a Nanometric ScaleScience, 1991
- Collection mode near-field scanning optical microscopyApplied Physics Letters, 1987