Some annealing characteristics of electrodeposited permalloy wires
- 1 March 1967
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Magnetics
- Vol. 3 (1) , 53-56
- https://doi.org/10.1109/tmag.1967.1066010
Abstract
Experiments have been carried out to evaluate the aging characteristics of electrodeposited permalloy memory films. It has been demonstrated that a worst case memory program is necessary for this purpose, as more fundamental magnetic measurements cannot be directly related to the memory performance. Aging is accelerated by annealing the specimens at elevated temperatures. It is found that degradation occurs much more rapidly when the specimen is annealed in a hard direction magnetic field.Keywords
This publication has 3 references indexed in Scilit:
- Measured Relaxation Times for the Uniaxial-Anisotropy Spectrum in Nonmagnetostrictive Permalloy FilmsJournal of Applied Physics, 1966
- Measurements of skew, dispersion, and creep in plated wiresIEEE Transactions on Communication and Electronics, 1964
- Aging and Stabilization of Electrodeposited Cylindrical Magnetic Thin FilmsJournal of Applied Physics, 1964