Nonresonant detection of electric force gradients by dynamic force microscopy
- 12 December 1994
- journal article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 65 (24) , 3143-3145
- https://doi.org/10.1063/1.112462
Abstract
A mechanoelectric cross-modulation scheme is proposed to enable direct and nonresonant detection of electric force gradients by dynamic force microscopy. The technique employs an ultrasonic vibration of the sample against a conductive tip, to which an alternating voltage is applied at a frequency near that of mechanical modulation, chosen well above the resonance frequency of the cantilever. The heterodyne mixing between the mechanically and the electrically induced oscillating charge densities on the tip gives rise to low frequency cross-modulation forces, proportional to the electric force gradients. The nonresonant detection of the first- and the second-order electric force gradients has successfully been performed, resulting in a dramatic enhancement of lateral resolution in surface potential imaging.Keywords
This publication has 15 references indexed in Scilit:
- Scanning maxwell stress microscope for nanometre-scale surface electrostatic imaging of thin filmsThin Solid Films, 1994
- Heterodyne Force-Detection for High Frequency Local Dielectric Spectroscopy by Scanning Maxwell Stress MicroscopyJapanese Journal of Applied Physics, 1993
- Voltage contrast in integrated circuits with 100 nm spatial resolution by scanning force microscopyJournal of Physics D: Applied Physics, 1993
- From Molecules to Cells: Imaging Soft Samples with the Atomic Force MicroscopeScience, 1992
- Kelvin probe force microscopyApplied Physics Letters, 1991
- High resolution atomic force microscopy potentiometryJournal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, 1991
- Atomic Force MicroscopyPhysics Today, 1990
- Localized charge force microscopyJournal of Vacuum Science & Technology A, 1990
- Contact electrification using force microscopyPhysical Review Letters, 1989
- Atomic force microscope–force mapping and profiling on a sub 100-Å scaleJournal of Applied Physics, 1987