Quantum efficiency and blooming suppression in junction charged-coupled devices
- 1 October 1978
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Journal of Solid-State Circuits
- Vol. 13 (5) , 728-730
- https://doi.org/10.1109/jssc.1978.1051130
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- Transparent metal oxide electrode CID imagerIEEE Journal of Solid-State Circuits, 1976
- Charge injection imaging: operating techniques and performances characteristicsIEEE Journal of Solid-State Circuits, 1976
- New structures for charge-coupled devicesProceedings of the IEEE, 1972
- The effect of a resistive sea on the performance of a silicon diode array camera tubeIEEE Transactions on Electron Devices, 1968