s-Shaped Software Reliability Growth Models and Their Applications
- 1 October 1984
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Reliability
- Vol. R-33 (4) , 289-292
- https://doi.org/10.1109/tr.1984.5221826
Abstract
The s-shaped growth curves of detected software errors can be observed in software testing. The delayed s-shaped and inflection s-shaped software reliability growth models based on a nonhomogeneous Poisson process are discussed. The software reliability growth types of the models are investigated in terms of the error detection rate per error. In addition, a viable method for the software quality assessment, which integrates the capture-recapture method and the models above, is discussed, and its application to actual test data is illustrated.Keywords
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