Characterization of triazine derivatives on silicon wafers studied by photoelectron spectroscopy (XPS, UPS) and metastable impact electron spectroscopy (MIES)
- 1 November 1996
- journal article
- Published by Elsevier in Applied Surface Science
- Vol. 103 (3) , 221-229
- https://doi.org/10.1016/0169-4332(96)00567-3
Abstract
No abstract availableKeywords
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