Measuring Properties of Fast Digitizers Employed for Recording HV Impulses
- 1 March 1983
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Instrumentation and Measurement
- Vol. 32 (1) , 17-22
- https://doi.org/10.1109/TIM.1983.4315002
Abstract
Requirements on measuring accuracy of high-voltage (HV) impulses employed for testing of self-restoring and non-self-restoring insulation are reviewed in order to select a suitable digitizer for the impulse recording. Certain models of fast digitizers are characterized by an apparently high time resolution, but their actual dynamic performance in case of measuring nonrepetitive, irregularly shaped impluses cannot be deduced from the manufacturer specification. The paper analyzes the "equivalent bits" characteristic which is frequently employed as a criterion of the digitizer dynamic performance, and an additional test of the digitization error distribution is proposed. Such a test results in another characteristic of the "equivalent bits," which is based on the maximum (rather than rms) error and which reflects the actual deformation of the recorded impulse form.Keywords
This publication has 3 references indexed in Scilit:
- Digital Techniques in High-Voltage MeasurementsIEEE Transactions on Power Apparatus and Systems, 1982
- A dynamic test method for high-resolution A/D convertersIEEE Transactions on Instrumentation and Measurement, 1982
- An Automated Test Set for High Resolution Analog-to-Digital and Digital-to-Analog ConvertersIEEE Transactions on Instrumentation and Measurement, 1979