Investigation of electrical properties of structures
- 1 January 1995
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 255 (1-2) , 266-268
- https://doi.org/10.1016/0040-6090(94)05668-4
Abstract
No abstract availableThis publication has 2 references indexed in Scilit:
- Investigations of the Electrical Properties of Porous SiliconJournal of the Electrochemical Society, 1991
- Two‐phase structure of plasma‐polymerized thiophene‐passivated GaAs Schottky‐like metal‐insulator‐semiconductor diodesJournal of Applied Physics, 1990