Resistivity and temperature coefficient of resistivity of tin films
- 1 July 1977
- journal article
- conference paper
- Published by Springer Nature in Journal of Materials Science
- Vol. 12 (7) , 1472-1476
- https://doi.org/10.1007/bf00540864
Abstract
No abstract availableThis publication has 14 references indexed in Scilit:
- The electrical resistivity and temperature coefficient of resistivity of cobalt filmsJournal of Physics D: Applied Physics, 1976
- Effect of grain-boundary scattering on the electrical resistivity of indium filmsJournal of Materials Science, 1976
- Electrical resistivity of polycrystalline bismuth filmsJournal of Vacuum Science and Technology, 1974
- Internal stresses and resistivity of low-voltage sputtered tungsten filmsJournal of Applied Physics, 1973
- On the electrical resistivity of evaporated thin cobalt films; an approach based on the Mayadas-Shatzkes modelSurface Science, 1973
- Electrical-Resistivity Model for Polycrystalline Films: the Case of Arbitrary Reflection at External SurfacesPhysical Review B, 1970
- Behavior of Film Conductance during Vacuum DepositionJournal of Applied Physics, 1963
- Der elektrische Widerstand dünner Zinnschichten mit GitterstörungenThe European Physical Journal A, 1952
- The Size-Variation of Resistivity for Mercury and TinProceedings of the Physical Society. Section A, 1949
- The conductivity of thin metallic films according to the electron theory of metalsMathematical Proceedings of the Cambridge Philosophical Society, 1938