The STEM approach to the imaging of surfaces and small particles
- 1 March 1983
- journal article
- Published by Wiley in Journal of Microscopy
- Vol. 129 (3) , 253-261
- https://doi.org/10.1111/j.1365-2818.1983.tb04182.x
Abstract
No abstract availableKeywords
This publication has 9 references indexed in Scilit:
- Performance and applications of electron energy loss spectroscopy in stemUltramicroscopy, 1982
- Microdiffraction from antiphase domain boundaries in Cu3AuActa Crystallographica Section A, 1982
- Surface energies and surface structure of small crystals studied by use of a stem instrumentSurface Science, 1982
- Convergent beam electron microdiffraction from small crystalsUltramicroscopy, 1981
- Coherent interference effects in SIEM and CBEDUltramicroscopy, 1981
- Convergent beam electron microdiffraction from small crystalsUltramicroscopy, 1981
- Direct observation of the phase transition between the (7 × 7) and (1 × 1) structures of clean (111) silicon surfacesSurface Science, 1981
- Surface imaging using diffracted electronsSurface Science, 1976
- Magnification variations in reflection electron microscopy using diffracted beamsUltramicroscopy, 1975