AT-SPEED TEST IS NOT NECESSARILY AN AC TEST
- 24 August 2005
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- No. 10893539,p. 722-728
- https://doi.org/10.1109/test.1991.519737
Abstract
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This publication has 1 reference indexed in Scilit:
- Arrangement of latches in scan-path design to improve delay fault coveragePublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002