Dispersion of Surface-Plasmon at Clean Si(001)-2×1 Surface

Abstract
Inelastic low-energy-electron-diffraction measurements on a clean Si(001)-2×1 surface were made. Surface cleanliness was verified by Auger analysis. The elastic and inelastic energy intensity profiles of the (00) spot were measured to select incident conditions amenable to a kinematic analysis of the energy loss profiles. The surface-plasmon dispersion relation for Si(001)-2×1 surface was derived from the inelastic data using a conservation-law model. The dispesion curve decreases as the momentum parallel to the surface increases.