Cube-root broadening of surface-charge packets
- 15 November 1981
- journal article
- conference paper
- Published by AIP Publishing in Applied Physics Letters
- Vol. 39 (10) , 843-845
- https://doi.org/10.1063/1.92579
Abstract
The width of a surface-charge packet in the proximity of a conducting sheet increases asymptotically only as the cube root of the time due to space-charge repulsion. By contrast, thermal diffusion broadens as the square root of the time, and is otherwise negligible here. The cube-root behavior is invariant over a wide range of transverse and normal electric fields, and may have significant implications for the minimum spatial variation of charge density achievable in devices.Keywords
This publication has 3 references indexed in Scilit:
- Measurement of the high-field drift velocity of electrons in inversion layers on siliconIEEE Electron Device Letters, 1981
- Applications of scaling to problems in high-field electronic transportJournal of Applied Physics, 1981
- Relation of drift velocity to low-field mobility and high-field saturation velocityJournal of Applied Physics, 1980