Exponential excitation expansion: A new method of vibration testing
- 1 January 1978
- journal article
- Published by Elsevier in Microelectronics Reliability
- Vol. 17 (6) , 575-582
- https://doi.org/10.1016/0026-2714(78)90438-9
Abstract
No abstract availableKeywords
This publication has 1 reference indexed in Scilit:
- Accelerated vibration fatigue life testing of leads and soldered jointsMicroelectronics Reliability, 1976