Error in surface state determination caused by numerical differentiation of Q–V data

This publication has 4 references indexed in Scilit:

• Static technique for precise measurements of surface potential and interface state density in MOS structures
  Applied Physics Letters, 1975
• A quasi-static technique for MOS C-V and surface state measurements
  Solid-State Electronics, 1970
• Error analysis of surface state density determination using the MOS capacitance method
  Solid-State Electronics, 1969
• Investigation of thermally oxidised silicon surfaces using metal-oxide-semiconductor structures
  Solid-State Electronics, 1965