Step Stress Aging of Plated Wire Memories
- 1 October 1968
- journal article
- website
- Published by Institute of Electrical and Electronics Engineers (IEEE) in Bell System Technical Journal
- Vol. 47 (8) , 1539-1559
- https://doi.org/10.1002/j.1538-7305.1968.tb00092.x
Abstract
A rate of 0.3 failures per billion hours or less is desirable for memory components in large integrated arrays. This unusually stringent requirement complicates the determination of lifetime from accelerated aging studies. The value and limitations o...Keywords
This publication has 5 references indexed in Scilit:
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- Some aging properties of cylindrical electrodeposited permalloy memory wiresIEEE Transactions on Magnetics, 1966
- Structural and Magnetic Characteristics of Annealed Electrodeposited Permalloy FilmsJournal of Applied Physics, 1966
- Aging and Stabilization of Electrodeposited Cylindrical Magnetic Thin FilmsJournal of Applied Physics, 1964
- Effects of Heat Treatment of Thin Ferromagnetic Films at Intermediate TemperaturesJournal of Applied Physics, 1958