Immobilization of phospholipids on silicon, platinum, indium/tin oxide and gold surfaces with characterization by x-ray photoelectron spectroscopy and time-of-flight secondary-ion mass spectrometry
- 31 December 1989
- journal article
- Published by Elsevier in Analytica Chimica Acta
- Vol. 225, 369-389
- https://doi.org/10.1016/s0003-2670(00)84626-7
Abstract
No abstract availableKeywords
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