Heavy ion and proton induced single event transients in comparators
- 1 December 1996
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Nuclear Science
- Vol. 43 (6) , 2960-2967
- https://doi.org/10.1109/23.556892
Abstract
No abstract availableThis publication has 2 references indexed in Scilit:
- Observation of heavy ion induced transients in linear circuitsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2005
- Observation of single event upsets in analog microcircuitsIEEE Transactions on Nuclear Science, 1993