Applications of AMS to electronic and silver halide imaging research
Open Access
- 1 December 1990
- journal article
- Published by Elsevier in Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
- Vol. 52 (3-4) , 502-506
- https://doi.org/10.1016/0168-583x(90)90466-8
Abstract
No abstract availableThis publication has 3 references indexed in Scilit:
- Anomalous diffusion of nitrogen in nitrogen-implanted siliconApplied Physics Letters, 1989
- Accelerator mass spectrometry at the university of RochesterNuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1987
- The Distribution of Cl Impurities in SiO2 Films Produced by Thermal Oxidation of Si in Cl‐Containing AmbientsJournal of the Electrochemical Society, 1986