Thin film characterization using analytical electron microscopy
- 1 September 1980
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 72 (1) , 177-192
- https://doi.org/10.1016/0040-6090(80)90572-6
Abstract
No abstract availableThis publication has 5 references indexed in Scilit:
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- Extended fine structure above the X-ray edge in electron energy loss spectraJournal of Physics D: Applied Physics, 1976
- The quantitative analysis of thin specimensJournal of Microscopy, 1975
- Electron penetration and the atomic number correction in electron probe microanalysisJournal of Physics D: Applied Physics, 1968
- Microanalysis by Means of ElectronsJournal of Applied Physics, 1944