Kx-ray emission from 20- to 36-MeV fluorine projectiles following electron capture to excited states
- 1 October 1974
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review A
- Vol. 10 (4) , 1255-1262
- https://doi.org/10.1103/physreva.10.1255
Abstract
The projectile x-ray emission cross sections for fluorine ions were measured under single collision conditions for charge states ranging from +4 to +9 in a thin argon target. The dependence of these cross sections upon the energy and the initial charge state of the projectile was determined for fluorine ions with energies between 20 and 36 MeV. Over the entire energy range, the x-ray—production cross section for ions was about 70% of the total electron-capture cross section determined in a separate experiment. The x-ray—production cross section for these fully stripped ions is attributed to electron capture to excited states of the projectile. Calculations of electron-capture cross sections within the Brinkman-Kramers approximation for these heavy-ion collisions are consistent with the observation of large cross sections for capture to excited states.
Keywords
This publication has 22 references indexed in Scilit:
- Observation ofKx rays from highly ionized states of neon produced by 40-MeVCl+7,Cl+11, andCl+13beamsPhysical Review A, 1974
- Projectile charge-state dependence ofKx-ray production by 1-4-MeV/amu heavy ions in gasesPhysical Review A, 1974
- Production of fast highly excited atoms in proton collisions with atomic hydrogen and argonPhysical Review A, 1974
- Experimental Electron-Transfer Cross Sections for Fluorine Ions in Argon at Energies from 8 to 54 MeVPhysical Review A, 1973
- Dependence of Argon-Shell Vacancy Production on the Electronic Structure of Swift Heavy ProjectilesPhysical Review A, 1973
- High-Resolution Study of NeX-Ray Transitions as a Function of Oxygen-Projectile Charge StatePhysical Review Letters, 1973
- Exponential Projectile Charge Dependence ofandX-Ray Production by Fast, Highly Ionized Argon Beams in Thin Neon TargetsPhysical Review Letters, 1973
- Projectile Structure Effects on NeonX-Ray Production by Fast, Highly Ionized Argon BeamsPhysical Review Letters, 1972
- Dependence of X-Ray Yields in Argon, Krypton, and Xenon upon the Charge State of Fluorine Ions at 35.7 MeVPhysical Review Letters, 1972
- Charge States and Charge-Changing Cross Sections of Fast Heavy Ions Penetrating Through Gaseous and Solid MediaReviews of Modern Physics, 1972