Crystallographic characterization of planes in the scanning electron microscope
- 31 January 1995
- journal article
- Published by Elsevier in Materials Characterization
- Vol. 34 (1) , 29-34
- https://doi.org/10.1016/1044-5803(94)00047-o
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
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- Microtexture determination by electron back-scatter diffractionJournal of Materials Science, 1992
- Influence of kinetic factors on distribution of grain boundary planes in nickelMaterials Science and Technology, 1991
- Local Texture Measurements by EBSP. New Computer ProceduresTexture, Stress, and Microstructure, 1991
- Measurement of boundary plane inclination in a scanning electron microscopeScripta Metallurgica, 1989