Optical measurements and modeling of an all solid state inorganic thin film electrochromic system
- 1 September 1997
- journal article
- Published by Elsevier in Journal of Non-Crystalline Solids
- Vol. 218, 296-301
- https://doi.org/10.1016/s0022-3093(97)00204-4
Abstract
No abstract availableThis publication has 2 references indexed in Scilit:
- PLASMA ION-ASSISTED EVAPORATIVE DEPOSITION OF SURFACE LAYERSAnnual Review of Materials Science, 1992
- Ion-assisted deposition with a new plasma sourceMaterials Science and Engineering: A, 1991