Standard test data for estimating peak parameter errors in x-ray photoelectron spectroscopy III. Errors with different curve-fitting approaches
- 18 December 2000
- journal article
- research article
- Published by Wiley in Surface and Interface Analysis
- Vol. 29 (12) , 856-872
- https://doi.org/10.1002/1096-9918(200012)29:12<856::aid-sia940>3.0.co;2-8
Abstract
No abstract availableKeywords
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