Inelastic effects in Auger electron spectroscopy
- 28 February 1970
- journal article
- other
- Published by Elsevier in Surface Science
- Vol. 19 (2) , 469-474
- https://doi.org/10.1016/0039-6028(70)90055-5
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- Thin reaction layers and the surface structure of silicon (111)Surface Science, 1969
- Analysis of Materials by Electron-Excited Auger ElectronsJournal of Applied Physics, 1968
- Use of LEED Apparatus for the Detection and Identification of Surface ContaminantsJournal of Applied Physics, 1967