Delocalized secondary-electron generation studied by momentum-resolved coincidence-electron spectroscopy

Publisher Website
Google Scholar
Abstract
The delocalization of the secondary-electron generation process is studied using momentum-resolved coincidence-electron spectroscopy in an ultrahigh-vacuum scanning transmission electron microscope. Secondary electrons are more efficiently produced by the decay of excitations resulting from large-momentum-transfer (spatially localized) inelastic scattering. The fraction of secondary electrons resulting from localized excitations can explain the high spatial resolution observed in secondary-electron microscopy images.