Validity of the kinematical approximation in transmission electron diffraction for the analysis of surface structures
- 28 February 1989
- journal article
- Published by Elsevier in Ultramicroscopy
- Vol. 27 (1) , 1-8
- https://doi.org/10.1016/0304-3991(89)90196-4
Abstract
No abstract availableKeywords
This publication has 9 references indexed in Scilit:
- Low-energy electron diffraction analysis of the Si(111)7×7 structureJournal of Vacuum Science & Technology A, 1988
- Observation of lattice fringes of the Si(111)–7×7 structure by reflection electron microscopy*Journal of Microscopy, 1986
- Structure analysis of Si(111)-7 × 7 reconstructed surface by transmission electron diffractionSurface Science, 1985
- Structural analysis of Si(111)-7×7 by UHV-transmission electron diffraction and microscopyJournal of Vacuum Science & Technology A, 1985
- High energy transmission electron diffraction and imaging studies of the silicon (111) 7 × 7 surface structureUltramicroscopy, 1983
- 7 × 7 Reconstruction on Si(111) Resolved in Real SpacePhysical Review Letters, 1983
- Direct observation of the phase transition between the (7 × 7) and (1 × 1) structures of clean (111) silicon surfacesSurface Science, 1981
- Numerical evaluations ofN-beam wave functions in electron scattering by the multi-slice methodActa Crystallographica Section A, 1974
- Kinematic Low-Energy Electron-Diffraction Intensities from Averaged Data: A Method for Surface CrystallographyPhysical Review Letters, 1971