Atomic Force Microscopy Study of Self-Affine Fractal Roughness of Porous Silicon Surfaces

This publication has 15 references indexed in Scilit:

• Validity of the Linear Growth Equation for Interface Evolution for Copper Electrodeposition in the Presence of Organic Additives
  Physical Review Letters, 1997
• Stable Growth and Kinetic Roughening in Electrochemical Deposition
  Physical Review Letters, 1994
• Scaling Analysis of SiO₂/Si Interface Roughness by Atomic Force Microscopy
  Japanese Journal of Applied Physics, 1994
• Analysis of fractal surfaces using scanning probe microscopy and multiple-image variography. 1. Some general considerations
  The Journal of Physical Chemistry, 1993
• Analysis of fractal surfaces using scanning probe microscopy and multiple-image variography. 2. Results on fractal and nonfractal surfaces, observation of fractal crossovers, and comparison with other fractal analysis techniques
  The Journal of Physical Chemistry, 1993
• Scanning tunneling microscopy observation of self-affine fractal roughness in ion-bombarded film surfaces
  Physical Review Letters, 1993
• Self-Affine Fractal Vapour-Deposited Gold Surfaces Characterization by Scanning Tunnelling Microscopy
  Europhysics Letters, 1992
• Kinetic growth with surface relaxation: Continuum versus atomistic models
  Physical Review Letters, 1991
• Continuum models of crystal growth from atomic beams with and without desorption
  Journal de Physique I, 1991
• Dynamic Scaling of Growing Interfaces
  Physical Review Letters, 1986