Picosecond Characterization of Ultrafast Phenomena: New Devices and New Techniques
- 1 January 1986
- book chapter
- Published by Springer Nature
Abstract
No abstract availableThis publication has 4 references indexed in Scilit:
- Characterization of TEGFETs and MESFETs Using the Electrooptic Sampling TechniquePublished by Springer Nature ,1985
- Development of a Picosecond Cryo-Sampler Using Electro-Optic TechniquesPublished by Springer Nature ,1985
- Transmission Line Designs With a Measured Step Response of 3 ps Per CentimeterPublished by Springer Nature ,1985
- Picosecond electro-optic sampling systemApplied Physics Letters, 1982