Heavy ion induced single hard errors on submicronic memories (for space application)
- 1 December 1992
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Nuclear Science
- Vol. 39 (6) , 1693-1697
- https://doi.org/10.1109/23.211355
Abstract
No abstract availableThis publication has 3 references indexed in Scilit:
- Heavy ion testing using the GANIL accelerator and compilation of results with predictionsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2003
- On the suitability of non-hardened high density SRAMs for space applicationsIEEE Transactions on Nuclear Science, 1991
- Ionization of SiO2 by Heavy Charged ParticlesIEEE Transactions on Nuclear Science, 1981