Accurate location and marking of grain boundaries using focused ion and electron beams
- 1 October 2000
- journal article
- research article
- Published by Elsevier in Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
- Vol. 170 (3-4) , 474-482
- https://doi.org/10.1016/s0168-583x(00)00254-8
Abstract
No abstract availableKeywords
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