Accurate measurement of atomic beam flux by pseudo-double-beam atomic absorption spectroscopy for growth of thin-film oxide superconductors
- 3 February 1992
- journal article
- conference paper
- Published by AIP Publishing in Applied Physics Letters
- Vol. 60 (5) , 657-659
- https://doi.org/10.1063/1.106584
Abstract
We report the use of pseudo-double-beam atomic absorption spectroscopy to make very accurate (0.1%–1%) measurements of the beam flux from Knudsen effusion cells in a molecular beam epitaxy system. This system has been used to grow Bi–Sr–Ca–Cu–O–based superconducting thin films and heterostructures in an atomic-layer-by-layer fashion. The resulting material displays excellent crystallographic and transport properties. Atomic absorption measurement of beam fluxes may also be of benefit for other materials systems, such as InGaAs/InP.Keywords
This publication has 4 references indexed in Scilit:
- Reactive coevaporation of YBaCuO superconducting filmsJournal of Materials Research, 1991
- Synthesis and properties of YBa2Cu3O7 thin films grown in situ by 90° off-axis single magnetron sputteringPhysica C: Superconductivity and its Applications, 1990
- Physical vapour deposition techniques for the growth of YBa2Cu3O7thin filmsSuperconductor Science and Technology, 1990
- The application of atomic absorption spectra to chemical analysisSpectrochimica Acta, 1955