Aliasing probability for multiple input signature analyzer
- 1 April 1990
- journal article
- letter
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Computers
- Vol. 39 (4) , 586-591
- https://doi.org/10.1109/12.54855
Abstract
Single and multiple multiple-input-signature-register (MISR) aliasing probability expressions are presented for arbitrary test lengths. A framework, based on algebraic codes, is developed for the analysis and synthesis of MISR-based test response compressors for BIST. This framework is used to develop closed-form expressions for the aliasing probability of MISR for arbitrary test length. An error model, based on q-ary symmetric channel, is proposed using more realistic assumptions. Results are presented that provide the weight distributions for q-ary codes (q=2/sup m/, where the circuit under test has m outputs). These results are used to compute the aliasing probability for the MISR compression technique for arbitrary test lengths. This result is extended to compression using two different MISRs. It is shown that significant improvements can be obtained by using two signature analyzers instead of one. The weight distribution of a class of codes of arbitrary length is also given.Keywords
This publication has 7 references indexed in Scilit:
- Aliasing errors in multiple input signature analysis registersPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2003
- An analysis of the probabilistic behavior of linear feedback signature registersIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 1989
- The binary weight distribution of the extended (2m,2m − 4) code of the Reed-Solomon code over GF(2m) with generator polynomial (x − α)(x − α2)(x − α3)Linear Algebra and its Applications, 1988
- Analysis and proposal of signature circuits for LSI testingIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 1988
- Bounds and analysis of aliasing errors in linear feedback shift registersIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 1988
- Comparative analysis of different implementations of multiple-input signature analyzersIEEE Transactions on Computers, 1988
- Measures of the Effectiveness of Fault Signature AnalysisIEEE Transactions on Computers, 1980