An analysis of systematic phase errors due to nonlinearity in fringe scanning systems
- 15 June 1986
- journal article
- Published by Elsevier in Optics Communications
- Vol. 58 (4) , 223-225
- https://doi.org/10.1016/0030-4018(86)90437-2
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
- Phase shifter calibration in phase-shifting interferometryApplied Optics, 1985
- Fringe scanning Ronchi test for aspherical surfacesApplied Optics, 1984
- Digital wave-front measuring interferometry: some systematic error sourcesApplied Optics, 1983
- Real-Time InterferometerOptical Engineering, 1979
- Digital Wavefront Measuring Interferometer for Testing Optical Surfaces and LensesApplied Optics, 1974