Magnetic force microscopy of domain wall stray fields on single-crystal iron whiskers
- 18 June 1990
- journal article
- research article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 56 (25) , 2578-2580
- https://doi.org/10.1063/1.102847
Abstract
Using a capacitively controlled force microscope we have imaged typical domain wall configurations like 90° closure structures and subdivided 180° wall segments in single‐crystal iron whiskers. Differences in wall contrast between 90° and 180° domain walls are clearly observed. The effect of tip‐to‐sample distance on lateral resolution and wall contrast in magnetic force microscopy is shown.Keywords
This publication has 16 references indexed in Scilit:
- Theory of magnetic force microscopyJournal of Vacuum Science & Technology A, 1990
- Analysis of Bloch-wall fine structures by magnetic force microscopyPhysical Review B, 1989
- Magnetic force microscopy of thin Permalloy filmsApplied Physics Letters, 1989
- Investigation of Bloch wall fine structures by magnetic force microscopyJournal of Microscopy, 1988
- Calculation of the Bloch wall contrast in magnetic force microscopyJournal of Microscopy, 1988
- Magnetic forces measured by atomic force microscopy. Theoretical approachJournal of Magnetism and Magnetic Materials, 1988
- Application of atomic force microscopy to magnetic materialsJournal of Vacuum Science & Technology A, 1988
- The theoretical aspect of atomic force microscopy used for magnetic materialsJournal of Magnetism and Magnetic Materials, 1988
- A theoretical analysis of Bitter-pattern evolutionJournal of Magnetism and Magnetic Materials, 1987
- Hysteresis of Néel-line motion and effective width of 180°Bloch walls in bulk ironPhysical Review B, 1986