Transmission electron microscopy and X-ray photoelectron spectroscopy investigations of the MoCuInSe2 interface
- 1 June 1984
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 116 (1-3) , L59-L62
- https://doi.org/10.1016/0040-6090(84)90455-3
Abstract
No abstract availableThis publication has 5 references indexed in Scilit:
- Heterojunction formation in (CdZn)S/CuInSe2 ternary solar cellsApplied Physics Letters, 1983
- The CdSCuInSe2 solar cell interface: Thermodynamic considerationsSolar Cells, 1983
- Properties of the Mo-CuInSe2 interfaceApplied Physics Letters, 1982
- A study of the initial oxidation of polycrystalline Si using surface analysis techniquesJournal of Vacuum Science and Technology, 1981
- High photocurrent polycrystalline thin-film CdS/CuInSe2 solar cellaApplied Physics Letters, 1980