Structural Characterisation of Iron-Copper Multilayers Using Transmission Electron Microscopy
- 1 January 1994
- journal article
- Published by Springer Nature in MRS Proceedings
Abstract
No abstract availableKeywords
This publication has 8 references indexed in Scilit:
- Relationship between structural phase transitions and elastic anomalies in metallic superlatticesJournal of Applied Physics, 1993
- The characterisation of GaAs/(Al,Ga)As heterostructure interface roughness using Fresnel analysisUltramicroscopy, 1991
- Structural properties of epitaxial films of Fe on Cu and Cu-based surface and bulk alloysSurface Science, 1989
- Sputter deposition of single crystal metal multilayersJournal of Crystal Growth, 1986
- High-resolution lattice imaging reveals a ‘phase transition’ in Cu/NiPd multilayersNature, 1986
- On elastic relaxation and long wavelength microstructures in spinodally decomposed InxGa1−x.AsyP1−yepitaxial layersPhilosophical Magazine A, 1985
- The relative accuracy of axial and non‐axial methods for the measurement of lattice spacingsJournal of Microscopy, 1983
- Elastic modulus in composition-modulated copper-nickel foilsJournal of Applied Physics, 1983