Large integrated crossbar switch

This publication has 6 references indexed in Scilit:

• On fault probabilities and yield models for analog VLSI neural networks
  Published by Institute of Electrical and Electronics Engineers (IEEE) ,2003
• Wafer-scale integration as a technology choice for high speed ATM switching systems
  Published by Institute of Electrical and Electronics Engineers (IEEE) ,2002
• Circuit design for a large area high-performance crossbar switch
  Published by Institute of Electrical and Electronics Engineers (IEEE) ,2002
• Reduction of simultaneous-switching noise in large crossbar networks
  IEEE Transactions on Circuits and Systems, 1991
• VLASIC: A Catastrophic Fault Yield Simulator for Integrated Circuits
  IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 1986
• Yield Model for Productivity Optimization of VLSI Memory Chips with Redundancy and Partially Good Product
  IBM Journal of Research and Development, 1980