Full-field x-ray fluorescence imaging microscope with a Wolter mirror

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Abstract
Full-field x-ray fluorescence(XRF) and transmission x-ray microscopic images were obtained with a Wolter-type mirror (10× magnification). A synchrotron radiation white beam (4–20 keV) from a bending magnet beamline at the Photon Factory was used to obtain XRFimages and a conventional laboratory x-ray source (8.04 keV) was used to obtain transmission x-rayimages. The effects of the coherent and the incoherent scatteringx rays on the contrast of an XRFimage were estimated. The scattering angle between the incidence x ray and the optical axis of the XRFmicroscope should be 90° to obtain the highest contrast image when the incidence x ray is horizontally polarized. Observation of small metallic inclusions in the synthesized diamond showed that the contrast of the XRFimage was better than that of the transmission x-rayimage.