Recent Trends in Parts SEU Susceptibility from Heavy Ions

1 January 1987

journal article
Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Nuclear Science

Vol. 34 (6) , 1332-1337
https://doi.org/10.1109/TNS.1987.4337475

Abstract

JPL and Aerospace have collected an extensive set of heavy ion single event upset (SEU) test data since their last joint publication in December, 1985. Trends in SEU susceptibility for state-of-the-art parts are presented.

Keywords

AEROSPACE TESTING
SINGLE EVENT UPSET
MOS DEVICES
PROPULSION
SATELLITES
EXTRATERRESTRIAL MEASUREMENTS
RANDOM ACCESS MEMORY
AEROSPACE ELECTRONICS
PROM
MANUFACTURING

This publication has 1 reference indexed in Scilit:

Trends in Parts Susceptibility to Single Event Upset from Heavy Ions
IEEE Transactions on Nuclear Science, 1985