Inductive determination of the critical current density of superconducting thin films without lateral structuring
- 1 February 1994
- journal article
- Published by Elsevier in Physica C: Superconductivity and its Applications
- Vol. 220 (1-2) , 209-214
- https://doi.org/10.1016/0921-4534(94)90903-2
Abstract
No abstract availableKeywords
This publication has 7 references indexed in Scilit:
- Depth profiling of Bi-Sr-Ca-Cu-O thin films by secondary neutrals mass spectroscopyPhysica C: Superconductivity and its Applications, 1993
- On the phase formation of laser deposited Bi-Sr-Ca-Cu-O films on MgO, ZrO2 and silicon with YSZ buffer layersPhysica C: Superconductivity and its Applications, 1991
- Automated system for resistance and critical current measurementsReview of Scientific Instruments, 1991
- A contactless method for measurement of the critical current density and critical temperature of superconducting filmsReview of Scientific Instruments, 1991
- Pulsed current measurement of the resistive transition and critical current in high T c superconductorsReview of Scientific Instruments, 1990
- A new inductive method for measuring the critical current density in high-Tc superconducting filmsPhysica C: Superconductivity and its Applications, 1989
- Inductive measurements of critical current density in superconducting thin filmsIEEE Transactions on Magnetics, 1989